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Reflectance/Transmittance Calculator

Substitution-method calculator for reflectance and transmittance measurements using integrating spheres, with optional port-loss correction.

Integrating sphere measurements of reflectance and transmittance use a substitution method: the sample signal S_sample is ratioed against a reference signal S_ref from a standard with known reflectance ρ_ref (or transmittance T_ref), giving the raw sample value as ρ_sample = ρ_ref × (S_sample/S_ref). Accuracy degrades when sample and reference reflectances differ significantly, because port losses — the fraction of sphere flux that escapes through the illumination and sample ports — shift with each substitution. The optional port-loss correction applies the generalized integrating-sphere model (Goebel 1967), requiring sphere wall reflectance ρ_w, total port fraction f, and sample port fraction f_s. Enter reference standard values, measured signals in volts, and enable the correction to see the corrected value and the magnitude of the correction. The tool supports both reflectance and transmittance measurement geometries.

Measurement Data
Reflectance Result
Signal ratio S_sample/S_ref
0.8562
Raw reflectance ρ_sample
0.8476
Abridged Optics — v1.0Substitution method assumes identical measurement conditions between reference and sample. Port-loss correction uses the generalized integrating-sphere theory from Goebel (1967).

All information, equations, and calculations have been compiled and verified to the best of our ability. For mission-critical applications, we recommend independent verification of all values. If you find an error, please let us know.